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ETH Zürich - D-PHYS - Solid State Physics - Microstructure Research - Instrumentation - STM

STM

Selected Article

Nat. Comm 7, 13611 (2016)
Critical exponents and scaling invariance in the absence of a critical point
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Proc. R. Soc. A 472, 2195 (2016)
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
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Phys. Rev. B 89, 014429 (2014)
Domain-wall free energy in Heisenberg ferromagnets
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Phys. Rev. B 87, 115436 (2013)
Scale invariance of a diodelike tunnel junction
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Scanning Tunneling microscopy (STM)
The STM-Model used in the Kerr-SPLEED and SKEM experimental setups

As one of the most valuable instruments for imaging surfaces at the atomic scale, the STM is part of all our UHV systems. The Kerr-SPLEED machine and the SKEM are equipped with essentially the same home built design shown on the photograph on the left.
Key features of both STM's are:

Atomic resolution on Si and GaAs

Three axis coarse positioning

In situ tip and sample exchange

Excellent vibration isolation
The SEMPA-STM

The main goal of this instrument is to be able to correlate the magnetic and structural properties of the very same micro- or nanostructure.The combination of a scanning electron microscope with polarization analysis and a in situ STM is so far unique.
Key features of the SEMPA STM are:

Simultaneous measurement of SEM and STM images

Atomic resolution on Si 7x7

In situ tip and sample exchange

Seven axis positioning (3 tip to sample, 4 STM to SEM)
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