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ETH Zürich - D-PHYS - Solid State Physics - Microstructure Research - Instrumentation - STM


Selected Article

Nat. Comm 7, 13611 (2016)
Critical exponents and scaling invariance in the absence of a critical point

Proc. R. Soc. A 472, 2195 (2016)
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
Phys. Rev. B 89, 014429 (2014)
Domain-wall free energy in Heisenberg ferromagnets

Phys. Rev. B 87, 115436 (2013)
Scale invariance of a diodelike tunnel junction
Scanning Tunneling microscopy (STM)
The STM-Model used in the Kerr-SPLEED and SKEM experimental setups

As one of the most valuable instruments for imaging surfaces at the atomic scale, the STM is part of all our UHV systems. The Kerr-SPLEED machine and the SKEM are equipped with essentially the same home built design shown on the photograph on the left.
Key features of both STM's are:

Atomic resolution on Si and GaAs

Three axis coarse positioning

In situ tip and sample exchange

Excellent vibration isolation

The main goal of this instrument is to be able to correlate the magnetic and structural properties of the very same micro- or nanostructure.The combination of a scanning electron microscope with polarization analysis and a in situ STM is so far unique.
Key features of the SEMPA STM are:

Simultaneous measurement of SEM and STM images

Atomic resolution on Si 7x7

In situ tip and sample exchange

Seven axis positioning (3 tip to sample, 4 STM to SEM)
© 2018 ETH Zürich | Impressum | 2004-08-06 15:37:15