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ETH Zürich - D-PHYS - Solid State Physics - Microstructure Research - Instrumentation - STM - Technical Information

Technical Information

Selected Article

Nat. Comm 7, 13611 (2016)
Critical exponents and scaling invariance in the absence of a critical point
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Proc. R. Soc. A 472, 2195 (2016)
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
>>
Phys. Rev. B 89, 014429 (2014)
Domain-wall free energy in Heisenberg ferromagnets
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Phys. Rev. B 87, 115436 (2013)
Scale invariance of a diodelike tunnel junction
>>
SEMPA-STM connections and axis definition
Scanner tube:
A = NC
B = NC
C = NC
D = Y neg (left)
E = X neg (top)
F = Y pos (right)
G = X pos (bottom)
H = NC
I = Z-electrode
J = NC

Sample position:
A = Y pos (left)
B = X neg (back)
C = X pos (fwd)
D = f 1.1 (CCW)
E = f 3.2 (GND)
F = f 1.2 (GND)
G = f 2.1 (CCW)
H = Y neg (right)
I = f 2.2 (GND)
J = f 3.1 (CCW)

Tip position:
A = NC
B = g 1 (tip CCW)
C = g 3 (tip CCW)
D = Y pos (left)
E = g 2 (tip CCW)
F = Y neg(right)
G = X pos (back)
H = X neg (fwd)
I = NC
J = NC
Achsendefinition
top
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